Typical damage that occurs more frequently in photovoltaic systems
 |
Hail damage to photovoltaic system Determination by inspection or photography with high tripod |
|
 |
Cell damage and contact defects Determination with electrolumizen method (EL) |
|
 |
Lightning damage | |
 |
Water ingress due to module leakage | |
 |
Solder contact error Increased resistance causes visible brown spots. |
|
 |
PID (potential-induced degradation) The term "PID" refers to product defects that lead to a drop in performance without visible damage to the PV module on the outside. Such yield-reducing damage can be determined, for example, by power measurement in combination with EL or IR measurements (see left).
|
|
 |
Start of a PID (potential-induced degradation) |
